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Standard [WITHDRAWN]

DIN IEC 60749:1987-09

Semiconductor devices; mechanical and climatic test methods; identical with IEC 60749, edition 1984

German title
Halbleiterbauelemente; Mechanische und klimatische Prüfverfahren; Identisch mit IEC 60749, Ausgabe 1984
Publication date
1987-09
Original language
German
Pages
18

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Publication date
1987-09
Original language
German
Pages
18

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Replacement amendments

This document replaces DIN 41794-1:1972-06 .

This document has been replaced by: DIN EN 60749-20:2010-04 , DIN EN 60749:2000-02 , DIN EN 60749:2001-09 , DIN EN 60749:2002-09 , DIN EN 60749-1:2003-12 , DIN EN 60749-2:2003-04 , DIN EN 60749-3:2003-04 , DIN EN 60749-4:2003-04 , DIN EN 60749-5:2003-09 , DIN EN 60749-6:2003-04 , DIN EN 60749-7:2003-04 , DIN EN 60749-8:2003-12 , DIN EN 60749-9:2003-04 , DIN EN 60749-10:2003-04 , DIN EN 60749-11:2003-04 , DIN EN 60749-12:2003-04 , DIN EN 60749-13:2003-04 , DIN EN 60749-14:2004-07 , DIN EN 60749-15:2003-10 , DIN EN 60749-19:2003-10 , DIN EN 60749-20:2003-12 , DIN EN 60749-21:2005-06 , DIN EN 60749-22:2003-12 , DIN EN 60749-25:2004-04 , DIN EN 60749-31:2003-12 , DIN EN 60749-32:2003-12 , DIN EN 60749-36:2003-12 .

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