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Standard [WITHDRAWN]

DIN EN 60749-10:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 10: Mechanisches Schocken (IEC 60749-10:2002); Deutsche Fassung EN 60749-10:2002
Publication date
2003-04
Original language
German
Pages
7
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Publication date
2003-04
Original language
German
Pages
7
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.
DOI
https://dx.doi.org/10.31030/9451330

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/9451330
Replacement amendments

This document replaces DIN EN 60749:2002-09 .

This document has been replaced by: DIN EN IEC 60749-10:2023-12 .

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