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Standard [WITHDRAWN]

DIN EN 60749-5:2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 60749-5:2003); Deutsche Fassung EN 60749-5:2003
Publication date
2003-09
Original language
German
Pages
10
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Publication date
2003-09
Original language
German
Pages
10
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Replacement amendments

This document replaces DIN EN 60749:2002-09 .

This document has been replaced by: DIN EN 60749-5:2018-01 .

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