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Standard [WITHDRAWN]

DIN EN 60749-5:2018-01

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 60749-5:2017); Deutsche Fassung EN 60749-5:2017
Publication date
2018-01
Original language
German
Pages
11

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Publication date
2018-01
Original language
German
Pages
11
DOI
https://dx.doi.org/10.31030/2765251

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/2765251
Replacement amendments

This document replaces DIN EN 60749-5:2003-09 .

This document has been replaced by: DIN EN IEC 60749-5:2024-09; VDE 0884-749-5:2024-09 .

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