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Standard [CURRENT]

DIN EN 60749-11:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 11: Rascher Temperaturwechsel; Zweibäderverfahren (IEC 60749-11:2002); Deutsche Fassung EN 60749-11:2002
Publication date
2003-04
Original language
German
Pages
10
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Publication date
2003-04
Original language
German
Pages
10
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.
DOI
https://dx.doi.org/10.31030/9449802

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/9449802
Replacement amendments

This document replaces DIN EN 60749:2002-09 .

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