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Energie- und Elektrotechnik

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Standard [CURRENT] 2013-10

DIN 51456:2013-10
Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)

This document specifies a method for the determination of the mass fractions of the elements Al (aluminium), As (arsenic), Ba (barium), Be (beryllium), Ca (calcium), Cd (cadmium), Co (cobalt), Cr ...

from 70.50 EUR VAT included

from 65.89 EUR VAT excluded

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Standard [CURRENT] 2018-04

DIN EN 60747-16-3:2018-04
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017

from 146.40 EUR VAT included

from 136.82 EUR VAT excluded

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Standard [CURRENT] 2005-03

DIN EN 60747-16-10:2005-03
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004

from 146.40 EUR VAT included

from 136.82 EUR VAT excluded

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Standard [CURRENT] 1994-09

DIN EN 60821:1994-09
IEC-821-VMEbus - Microprocessor system bus for 1 byte to 4 byte data (IEC 60821:1991, modified); German version EN 60821:1994

from 318.20 EUR VAT included

from 297.38 EUR VAT excluded

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Standard [CURRENT] 2002-10

DIN EN 61523-1:2002-10
Delay and power calculation standards - Part 1: Integrated circuit delay and power calculation systems (IEC 61523-1:2001); German version EN 61523-1:2002, text in English

from 345.10 EUR VAT included

from 322.52 EUR VAT excluded

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Standard [CURRENT] 2003-06

DIN EN 61523-2:2003-06
Delay and power calculation standards - Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (IEC 61523-2:2002); German version EN 61523-2:2002, text in English

from 117.70 EUR VAT included

from 110.00 EUR VAT excluded

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Standard [CURRENT] 2001-10

DIN EN 61943:2001-10
Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999); German version EN 61943:1999

from 99.10 EUR VAT included

from 92.62 EUR VAT excluded

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Standard [CURRENT] 2000-01

DIN EN 61964:2000-01
Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999

from 85.30 EUR VAT included

from 79.72 EUR VAT excluded

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Standard [CURRENT] 2019-09

DIN EN IEC 61967-1:2019-09; VDE 0847-21-1:2019-09
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 61967-1:2018); German version EN IEC 61967-1:2019

74.04 EUR VAT included

69.20 EUR VAT excluded

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Standard [CURRENT] 2006-03

DIN EN 61967-2:2006-03
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005

from 99.10 EUR VAT included

from 92.62 EUR VAT excluded

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