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Standards Worldwide
Standards Worldwide
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Energie- und Elektrotechnik

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Standard [CURRENT] 2011-11

DIN EN 60204-33:2011-11; VDE 0113-33:2011-11
Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment (IEC 60204-33:2009, modified); German version EN 60204-33:2011

This part of DIN EN 60204 (VDE 0113) applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of ...

192.17 EUR VAT included

179.60 EUR VAT excluded

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Standard [CURRENT] 1997-08

DIN EN 60617-5:1997-08
Graphical symbols for diagrams - Part 5: Semiconductors and electron tubes (IEC 60617-5:1996); German version EN 60617-5:1996

from 135.10 EUR VAT included

from 126.26 EUR VAT excluded

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Draft standard 2024-06

DIN EN IEC 60747-15:2024-06 - Draft
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023

from 169.10 EUR VAT included

from 158.04 EUR VAT excluded

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Standard [CURRENT] 2012-08

DIN EN 60747-15:2012-08
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012

This part of IEC 60747 contains the requirements for isolated power semiconductor devices with the exception of devices containing built-in control circuits. These requirements apply in addition ...

from 112.30 EUR VAT included

from 104.95 EUR VAT excluded

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Standard [CURRENT] 2021-10

DIN EN IEC 60747-17:2021-10; VDE 0884-17:2021-10
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (IEC 60747-17:2020 + COR1:2021); German version EN IEC 60747-17:2020 + AC:2021

115.04 EUR VAT included

107.51 EUR VAT excluded

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Standard [CURRENT] 2003-12

DIN EN 60749-1:2003-12
Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003

from 56.60 EUR VAT included

from 52.90 EUR VAT excluded

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Standard [CURRENT] 2003-04

DIN EN 60749-2:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002

from 56.60 EUR VAT included

from 52.90 EUR VAT excluded

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Standard [CURRENT] 2018-01

DIN EN 60749-3:2018-01
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017

from 85.30 EUR VAT included

from 79.72 EUR VAT excluded

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Standard [CURRENT] 2017-11

DIN EN 60749-4:2017-11
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017

The suitability of semiconductor components for different applications also depends on the climatic and mechanical environmental influences to which these components are exposed. The DIN EN 60749 ...

from 77.90 EUR VAT included

from 72.80 EUR VAT excluded

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Standard [CURRENT] 2024-09

DIN EN IEC 60749-5:2024-09; VDE 0884-749-5:2024-09
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2023); German version EN IEC 60749-5:2024

41.72 EUR VAT included

38.99 EUR VAT excluded

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