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Standards Worldwide
Standards Worldwide
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Energie- und Elektrotechnik

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Standard [CURRENT] 1987-08

DIN 50450-1:1987-08
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

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Standard [CURRENT] 1991-03

DIN 50450-2:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N₂, Ar, He, Ne and H₂ by using a galvanic cell

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

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Standard [CURRENT] 1993-09

DIN 50450-4:1993-09
Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C₁-C₃-hydrocarbons in nitrogen by gas-chromatography

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

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Standard [CURRENT] 2021-07

DIN 50450-9:2021-07
Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C₁-C₃-hydrocarbons in gaseous hydrogen chloride by gaschromatography

from 42.10 EUR VAT included

from 39.35 EUR VAT excluded

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Standard [CURRENT] 2014-11

DIN 50451-3:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS

from 77.90 EUR VAT included

from 72.80 EUR VAT excluded

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Standard [NEW] 2024-09

DIN 50451-4:2024-09
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)

from 70.50 EUR VAT included

from 65.89 EUR VAT excluded

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Standard [CURRENT] 2022-08

DIN 50451-5:2022-08
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram

from 56.60 EUR VAT included

from 52.90 EUR VAT excluded

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Standard [CURRENT] 2014-11

DIN 50451-6:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH₄F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid

from 63.80 EUR VAT included

from 59.63 EUR VAT excluded

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Standard [CURRENT] 2018-04

DIN 50451-7:2018-04
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS

from 63.80 EUR VAT included

from 59.63 EUR VAT excluded

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Standard [CURRENT] 2022-08

DIN 50451-8:2022-08
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS

from 56.60 EUR VAT included

from 52.90 EUR VAT excluded

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