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Draft standard [WITHDRAWN]

DIN EN IEC 60749-28:2024-05 - Draft

VDE 0884-749-28:2024-05

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 60749-28:2022); Deutsche Fassung EN IEC 60749-28:2022
Date of issue
2024-04-26
Publication date
2024-05
Original language
German
Pages
49

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Date of issue
2024-04-26
Publication date
2024-05
Original language
German
Pages
49

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Replacement amendments

This document has been replaced by: DIN EN IEC 60749-28:2024-12; VDE 0884-749-28:2024-12 .

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