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Standard [NEW]

DIN EN IEC 60749-28:2024-12

VDE 0884-749-28:2024-12

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 60749-28:2022); Deutsche Fassung EN IEC 60749-28:2022
Publication date
2024-12
Original language
German
Pages
51

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Publication date
2024-12
Original language
German
Pages
51

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Replacement amendments

This document replaces DIN EN 60749-28:2018-02; VDE 0884-749-28:2018-02 .

Document timeline
CURRENT STANDARD
2024-12 - 2024-12

Standard [NEW]

DIN EN IEC 60749-28:2024-12; VDE 0884-749-28:2024-12
WITHDRAWN
2024-05 - 2024-12

Draft standard [WITHDRAWN]

DIN EN IEC 60749-28:2024-05; VDE 0884-749-28:2024-05
2018-02 - 2024-12

Standard [WITHDRAWN]

DIN EN 60749-28:2018-02; VDE 0884-749-28:2018-02

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