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Standard [CURRENT]

DIN EN 60749-28:2018-02

VDE 0884-749-28:2018-02

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 60749-28:2017); Deutsche Fassung EN 60749-28:2017
Publication date
2018-02
Original language
German
Pages
50

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Publication date
2018-02
Original language
German
Pages
50

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Replacement amendments

Intended replacement to be replaced as of 2024-12 with: DIN EN IEC 60749-28:2024-12; VDE 0884-749-28:2024-12 .

To be replaced by DIN EN IEC 60749-28:2024-12; VDE 0884-749-28:2024-12 .

Document timeline
PRE-PUBLISHED
2024-12

Standard [AVAILABLE PRE-PUBLICATION]

DIN EN IEC 60749-28:2024-12; VDE 0884-749-28:2024-12
Drafts
2024-05 - 2024-12

Draft standard

DIN EN IEC 60749-28:2024-05; VDE 0884-749-28:2024-05
intended to be withdrawn
2018-02 - 2024-12

Standard

DIN EN 60749-28:2018-02; VDE 0884-749-28:2018-02

Cooperation at DIN

Relationship to other standards
This document references:
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