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Standard [WITHDRAWN]

DIN EN 60749-28:2018-02

VDE 0884-749-28:2018-02

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 60749-28:2017); Deutsche Fassung EN 60749-28:2017
Publication date
2018-02
Original language
German
Pages
50

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Publication date
2018-02
Original language
German
Pages
50

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Replacement amendments

This document has been replaced by: DIN EN IEC 60749-28:2024-12; VDE 0884-749-28:2024-12 .

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