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Technical rule [CURRENT]

VDI/VDE 5575 Blatt 2:2019-12

X-ray optical systems - Measurement methods; Measurement set-up and methods for the evaluation of X-ray optical systems

German title
Röntgenoptische Systeme - Messverfahren; Messaufbau und Methoden zur Bewertung röntgenoptischer Systeme
Publication date
2019-12
Original language
German, English
Pages
31

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Publication date
2019-12
Original language
German, English
Pages
31

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Short description
The standard describes the measurement set-up and methods to evaluate X-ray optical systems. Methods to characterise geometric properties of X-rays are described as well as approaches for their spectral analysis. Coordinate systems for non-ambiguous description of the measurement set-up are defined. Positioning and detector systems suitable for the different measurement tasks are specified. An overview of common X-ray sources is given. The typical properties of the different X-ray sources relevant for their measurement are described.
Content
ICS
17.180.30
Replacement amendments

This document replaces VDI/VDE 5575 Blatt 2:2015-06 .

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