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Standard [CURRENT]

SN EN 62373:2006-08

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

German title
Stabilitätsprüfung unter Temperatur-Spannungs-Beanspruchung für Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET)
Publication date
2006-08
Original language
German
Pages
12

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Publication date
2006-08
Original language
German
Pages
12

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