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Standard [CURRENT]

NF C96-051:2006-10-01

NF EN 62373:2006-10-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

German title
Stabilitätsprüfung unter Temperatur-Spannungs-Beanspruchung für Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET)
Publication date
2006-10-01
Original language
French
Pages
15

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Publication date
2006-10-01
Original language
French
Pages
15

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