Standard
[CURRENT]
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IEC 60749-8:2002-08
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 8: Dichtheit
- Publication date
-
2002-08
- Original language
-
English,
French
- Pages
- 31
- Publication date
-
2002-08
- Original language
-
English,
French
- Pages
- 31
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Replacement amendments
This document has been modified by: IEC 60749-8 Corrigendum 1:2003-04,IEC 60749-8 Corrigendum 2:2003-08
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