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IEC 60749-33:2005-11

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: Beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung
Publication date
2005-11
Original language
English, French
Pages
26
Publication date
2005-11
Original language
English, French
Pages
26

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