IEC 60749-2:2002-04

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck
Publication date: 2002-04
Original language: English, French
Pages: 11

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Replacement amendments

This document has been modified by: IEC 60749-2 Corrigendum 1:2003-08

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