Standard [WITHDRAWN]
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In addition to the scope of DIN EN 61326-1 (VDE 0843-20-1):2013, this part of the DIN EN 61326 (VDE 0843-20) standard series specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and selects the appropriate test level specifications of DIN EN 61326-1 (VDE 0843-20-1):2013. Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers, network analysers, analogue instruments, digital multimeters (DMM) and board test systems. The responsible committee is DKE/UK 921.3 "Elektromagnetische Verträglichkeit in der Leittechnik" ("Electromagnetic compatibility in process control technology") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
This document replaces DIN EN 61326-2-1:2006-10; VDE 0843-20-2-1:2006-10 .
This document has been replaced by: DIN EN IEC 61326-2-1:2022-11; VDE 0843-20-2-1:2022-11 .