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Standard [WITHDRAWN]

DIN EN 60749-17:2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003); German version EN 60749-17:2003

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 17: Neutronenbestrahlung (IEC 60749-17:2003); Deutsche Fassung EN 60749-17:2003
Publication date
2003-09
Original language
German
Pages
7
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Publication date
2003-09
Original language
German
Pages
7
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.
DOI
https://dx.doi.org/10.31030/9509576

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/9509576
Replacement amendments

This document has been replaced by: DIN EN IEC 60749-17:2019-11; VDE 0884-749-17:2019-11 .

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