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Standard [WITHDRAWN]

DIN 50451-1:2003-04

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

German title
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 1: Silber (Ag), Gold (Au), Calcium (Ca), Kupfer (Cu), Eisen (Fe), Kalium (K) und Natrium (Na) in Salpetersäure mittels AAS
Publication date
2003-04
Original language
German
Pages
8
Note
The issuing body recommends using {0} DIN 50451-3:2014-11 .

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Publication date
2003-04
Original language
German
Pages
8
Note
The issuing body recommends using {0} DIN 50451-3:2014-11 .
DOI
https://dx.doi.org/10.31030/9476120

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ICS
29.045
DOI
https://dx.doi.org/10.31030/9476120
Replacement amendments

This document replaces DIN 50451-1:1987-10 .

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