Production equipment for microsystems - Determination of the influence of materials on the optical and tactile dimensional metrology - Part 3: Derivation of correction values for tactile measuring devices
German title
Fertigungsmittel für Mikrosysteme - Ermittlung von Materialeinflüssen auf die optische und taktile dimensionelle Messtechnik - Teil 3: Ableitung von Korrekturwerten für taktile Messgeräte
Publication date
2025-05
Original language
German
Pages
31
Publication date
2025-05
Original language
German
Pages
31
DOI
https://dx.doi.org/10.31030/3597483
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