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Draft standard

OEVE/OENORM EN 62047-27:2015-12-15 - Draft

Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT) (IEC 47F/230/CDV) (english version)

Publication date
2015-12-15
Original language
English
Pages
18

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Publication date
2015-12-15
Original language
English
Pages
18

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