VDI/VDE 5575 Blatt 4:2011-08

X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors

German title: Röntgenoptische Systeme - Röntgenspiegel - Totalreflexions- und Multischichtspiegel
Publication date: 2011-08
Original language: German, English
Pages: 19

Publication date: 2011-08
Original language: German, English
Pages: 19

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Short description

This guideline deals with reflective X-ray optical systems, which use total reflection as well as Bragg reflection on inner interfaces of a multilayer structure to influence the spectral composition and the directional characteristic. The physical principles and determining parameters of these X-ray mirrors are described. The role and influence of substrate and coatings are explained. Total reflection mirrors and multilayer mirrors for various applications are discussed. The most important X-ray optical systems using X-ray mirrors (Kirkpatrick-Baez, Wolter, Schwarzschild, Montel und EUVL optics) are introduced briefly.

Content

ICS

17.180.30

Replacement amendments

This document has been replaced by: VDI/VDE 5575 Blatt 4:2018-09 .

Also available in

Loading recommended items...