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Technical rule [WITHDRAWN]

VDI/VDE 5575 Blatt 4:2011-08

X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors

German title
Röntgenoptische Systeme - Röntgenspiegel - Totalreflexions- und Multischichtspiegel
Publication date
2011-08
Original language
German, English
Pages
19

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Publication date
2011-08
Original language
German, English
Pages
19

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Short description
This guideline deals with reflective X-ray optical systems, which use total reflection as well as Bragg reflection on inner interfaces of a multilayer structure to influence the spectral composition and the directional characteristic. The physical principles and determining parameters of these X-ray mirrors are described. The role and influence of substrate and coatings are explained. Total reflection mirrors and multilayer mirrors for various applications are discussed. The most important X-ray optical systems using X-ray mirrors (Kirkpatrick-Baez, Wolter, Schwarzschild, Montel und EUVL optics) are introduced briefly.
Content
ICS
17.180.30
Replacement amendments

This document has been replaced by: VDI/VDE 5575 Blatt 4:2018-09 .

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