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Technical rule [WITHDRAWN]

VDE/VDI 2604:1971-06

VDI/VDE 2604:1971-06

Surface measuring methods; roughness analysis by means of interference microscopy

German title
Oberflächen-Meßverfahren; Rauheitsuntersuchung mittels Interferenzmikroskopie
Publication date
1971-06
Original language
German
Pages
11

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Publication date
1971-06
Original language
German
Pages
11

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Replacement amendments

This document has been replaced by: VDI/VDE 2655 Blatt 1.2:2010-10 .

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