Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Technical rule [CURRENT]

DIN SPEC 52407:2015-03

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

German title
Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)
Publication date
2015-03
Original language
German
Pages
23
Procedure
Technical report

from 68.10 EUR VAT included

from 63.64 EUR VAT excluded

Format and language options

PDF download
  • 68.10 EUR

Shipment (3-5 working days)
  • 82.40 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2015-03
Original language
German
Pages
23
Procedure
Technical report
DOI
https://dx.doi.org/10.31030/2296172

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Content
ICS
07.120
DOI
https://dx.doi.org/10.31030/2296172

Cooperation at DIN

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...