Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
German title
Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)
Publication date
2015-03
Original language
German
Pages
23
Procedure
Technical report
Publication date
2015-03
Original language
German
Pages
23
Procedure
Technical report
DOI
https://dx.doi.org/10.31030/2296172
Product information on this site:
Quick delivery via download or delivery service
Buy securely with a credit card or pay upon receipt of invoice
All transactions are encrypted
Content
ICS
07.120
DOI
https://dx.doi.org/10.31030/2296172
Cooperation at DIN
Please get in touch with the relevant contact person at DIN if you have problems understanding the content of the standard or need advice on how to apply it.