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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

SN EN IEC 60749-30:2020-09

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen
Publication date
2020-09
Original language
German
Pages
15

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Publication date
2020-09
Original language
German
Pages
15

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