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Standard [CURRENT]

SN EN 62417:2010-05

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

German title
Halbleiterbauelemente - Prüfverfahren auf mobile Ionen für Feldeffekttransistoren mit Metall-Oxid- Halbleiter (MOSFET)
Publication date
2010-05
Original language
German
Pages
7

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Publication date
2010-05
Original language
German
Pages
7

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