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Standard [CURRENT]

SN EN 60749-40:2011-09

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 40: Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen
Publication date
2011-09
Original language
German
Pages
21

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Publication date
2011-09
Original language
German
Pages
21

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