Semiconductor devices - Mechanical and climatic test methods. Part 33: Accelerated moisture resistance - Unbiased autoclave
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren. Teil 33: Beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung
Publication date
2004-04
Original language
German
Pages
9
Publication date
2004-04
Original language
German
Pages
9
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