Standard
[CURRENT]
SN EN 60749-29:2011-08
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung
- Publication date
-
2011-08
- Original language
-
German
- Pages
- 25
- Publication date
-
2011-08
- Original language
-
German
- Pages
- 25
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