Standard
[CURRENT]
SN EN 60749-23:2004-04
Semiconductor devices - Mechanical and climatic test methods. Part 23: High temperature operating life
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren. Teil 23: Lebensdauer bei hoher Temperatur
- Publication date
-
2004-04
- Original language
-
German
- Pages
- 10
- Publication date
-
2004-04
- Original language
-
German
- Pages
- 10
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