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Standard [CURRENT]

SN EN 60749-23:2004-04

Semiconductor devices - Mechanical and climatic test methods. Part 23: High temperature operating life

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren. Teil 23: Lebensdauer bei hoher Temperatur
Publication date
2004-04
Original language
German
Pages
10

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Publication date
2004-04
Original language
German
Pages
10

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