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Standard [NEW]

OVE EN IEC 60749-5:2024-10-01

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (( IEC 60749-5:2023) EN IEC 60749-5:2024) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (( IEC 60749-5:2023) EN IEC 60749-5:2024) (deutsche Fassung)
Publication date
2024-10-01
Original language
German
Pages
12

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Publication date
2024-10-01
Original language
German
Pages
12

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