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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

OVE EN IEC 60749-41:2023-04-01

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices ((IEC 60749-41:2020) EN IEC 60749-41:2020) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Standardisierte Prüfverfahren für die Zuverlässigkeit von nichtflüchtigen Speicher-Bauelementen ((IEC 60749-41:2020) EN IEC 60749-41:2020) (deutsche Fassung)
Publication date
2023-04-01
Original language
German
Pages
28

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Publication date
2023-04-01
Original language
German
Pages
28

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