OVE EN 60749-5:2018-02-01

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017) (german version)

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 60749-5:2017) (deutsche Fassung)
Publication date: 2018-02-01
Original language: German
Pages: 12

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Replacement amendments

This document has been replaced by: OVE EN IEC 60749-5:2024-10-01 .

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