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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

OEVE/OENORM EN 62047-22:2015-06-01

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014) (german version)

German title
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 22: Elektromechanisches Zug-Prüfverfahren für leitfähige Dünnschichten auf flexiblen Substraten (IEC 62047-22:2014) (deutsche Fassung)
Publication date
2015-06-01
Original language
German
Pages
12

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Publication date
2015-06-01
Original language
German
Pages
12

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