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Standard [CURRENT]

OEVE/OENORM EN 60749-40:2012-04-01

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 40: Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen (IEC 60749-40:2011) (deutsche Fassung)
Publication date
2012-04-01
Original language
German
Pages
23

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Publication date
2012-04-01
Original language
German
Pages
23

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