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Standard [CURRENT]

OEVE/OENORM EN 60749-11:2003-10-01

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method (IEC 60749-11:2002 + Corr. 1:2003)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüvferfahren - Teil 11: Rascher Temperaturwechsel - Zweibäderverfahren (IEC 60749-11:2002 + Corr. 1:2003)
Publication date
2003-10-01
Original language
German
Pages
10

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Publication date
2003-10-01
Original language
German
Pages
10

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