Semiconductor devices - Micro-electromechanical devices - Part 11: test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
German title
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 11: Prüfverfahren für lineare thermische Ausdehnungskoeffizienten für freistehende Werstoffe der Mikrosystemtechnik
Publication date
2014-03-12
Original language
French
Pages
23
Publication date
2014-03-12
Original language
French
Pages
23
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