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Semiconductor devices - Mechanical and climatic test methods - Part 24: accelerated moisture resistance - Unbiased HAST
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigte Wirkung (HAST) ohne elektrische Beanspruchung
Publication date
2005-12-01
Original language
English,
French
Pages
15
Publication date
2005-12-01
Original language
English,
French
Pages
15
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