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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

NF C96-017:2008-01-01

NF EN 62374:2008-01-01

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

German title
Halbleiterbauelemente - Prüfung des zeitabhängigen dielektrischen Durchbruchs (TDDB) für dielektrische Gate-Schichten
Publication date
2008-01-01
Original language
French
Pages
25

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Publication date
2008-01-01
Original language
French
Pages
25

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