Standard
[CURRENT]
NF C96-017-1:2011-06-01
NF EN 62374-1:2011-06-01
Semiconductor devices - Part 1: time-dependent dielectric breakdown (TDDB) test for inter-metal layers
- German title
- Halbleiterbauelemente - Teil 1: Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen
- Publication date
-
2011-06-01
- Original language
-
French
- Pages
- 25
- Publication date
-
2011-06-01
- Original language
-
French
- Pages
- 25
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