Surface chemical analysis - X-ray photoelectron spectroscopy - Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
German title
Chemische Oberflächenanalyse - Röntgenphotoelektronenspektrometrie - Methode der Intensitätskalibrierung für mit Quarzkristallen monochromatisierte Al Kα XPS-Geräte
Publication date
2024-06
Original language
English
Pages
27
Publication date
2024-06
Original language
English
Pages
27
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Content
ICS
71.040.40
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