We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

ISO 23170:2022-06

Surface chemical analysis - Depth profiling - Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

German title
Chemische Oberflächenanalyse - Tiefenprofilierung - Zerstörungsfreie Tiefenprofilierung nanoskaliger Schwermetalloxid-Dünnschichten auf Si-Substraten mit mittelenergetischer Ionenstreuung
Publication date
2022-06
Original language
English
Pages
29

Please select

from 166.60 EUR VAT included

from 155.70 EUR VAT excluded

Purchasing options

PDF download

  • 166.60 EUR

Shipment (3-5 working days)

  • 188.90 EUR

Standards Ticker 1
1

Learn more about the standards ticker

Publication date
2022-06
Original language
English
Pages
29

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Content
ICS
71.040.40

Cooperation at DIN

Loading recommended items...
Loading recommended items...
Loading recommended items...