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Standard [WITHDRAWN]

ISO 20263:2017-11

Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials

German title
Mikrobereichsanalyse - Analytische Elektronenmikroskopie - Verfahren zur Bestimmung von Grenzschichtpositionen in der Querschnittsaufnahme von mehrschichtigen Materialien
Publication date
2017-11
Original language
English
Pages
45

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Publication date
2017-11
Original language
English
Pages
45

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Content
ICS
37.020, 71.040.50
Replacement amendments

This document has been replaced by: ISO 20263:2024-11 .

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