Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
German title
Chemische Oberflächenanalyse - Rasterkraftmikroskopie - Verfahren zur in situ-Charakterisierung des Schaftprofils von AFM-Sonden zur Messung von Nanostrukturen
Publication date
2014-07
Original language
English
Pages
25
Publication date
2014-07
Original language
English
Pages
25
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Content
ICS
71.040.40
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