Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
German title
Halbleiterbauelemente - Flexible und dehnbare Halbleiterbauelemente - Teil 1: Biegeprüfverfahren für elektrisch leitfähige Dünnschichten auf flexiblen Substraten
Publication date
2017-04
Original language
English
Pages
15
Publication date
2017-04
Original language
English
Pages
15
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