IEC 60749-5:2017-04

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung
Publication date: 2017-04
Original language: English
Pages: 9

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