Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT] Article is not orderable

IEC 60749-44:2016-07

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen
Publication date
2016-07
Original language
English, French
Pages
41
Publication date
2016-07
Original language
English, French
Pages
41

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...