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IEC 60749-42:2014-08

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 42: Lagerung bei Wärme und Feuchte
Publication date
2014-08
Original language
English, French
Pages
16
Publication date
2014-08
Original language
English, French
Pages
16

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