Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT] Article is not orderable

IEC 60749-40:2011-07

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 40: Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen
Publication date
2011-07
Original language
English, French
Pages
44
Publication date
2011-07
Original language
English, French
Pages
44

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...